Posted:2 months ago| Platform:
Work from Office
Full Time
Strong background and experience with Scan design, Clock architecture, ATPG methodology and industry standard tools Worked on Test compressions and decompression scan methodology generating test patterns at block and SoC level. Worked on ATPG test pattern generation stuck-at and at-speed with depth fault coverage analysis identifying issues to meet the coverage targets. Worked on boundary Scan test plan, test coverage with JTAG Understand MBIST concepts and insertion and test the integration at partition and SoC level. Understand the concept of memory redundancy logic. Understand JTAG concepts with all jtag IEEE standards Worked on industry standard DFT tools Strong knowledge on scripting in TCL/Perl/Python. Must possess good communication skills, be a self-driven individual and a good team player
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